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Investigation on interface related charge trap and loss characteristics of high-k based trapping str
  • ISSN号：0003-6951
  • 期刊名称：Appl. Phys. Lett
  • 时间：0
  • 页码：3504-
  • 相关项目：纳米加工与新型半导体器件研究
作者： Zhu, Chenxin|Zhang, Guangyu|Li, Fanghua|Liu, Ming|Xu, Zhongguang|Huo, Zongliang| Yang, Rong|Zheng, Zhiwei|Cui,Yanxiang|Liu, Jing|Wang, Yumei|Shi, Dongxia|
同期刊论文项目
纳米加工与新型半导体器件研究
期刊论文 101 会议论文 13 获奖 2 专利 121
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