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中文摘要：
采用sol-gel方法在石英玻璃衬底上制备出α轴取向的多晶Bi4Ti3O12（BIT）薄膜,根据透射谱曲线得到薄膜样品的线性折射率为2.35,线性吸收系数为9.81×10^3cm^-1,光学带隙宽度为3.60 eV。以脉宽300 fs,波长800 nm的钛蓝宝石脉冲激光为光源,利用单光束Z-scan技术测得薄膜样品的双光子吸收系数为100.31GW·cm^-2,三阶非线性折射率为-1.02×10^2GW·cm^-2。实验结果表明,所制备的BIT铁电薄膜具有大的非线性光学系数,适合应用于光子器件的制备。
英文摘要：
The polycrystalline Bi4Ti3O12 （BIT） thin films with a-orientation were fabricated on the quartz substrates by a sol-gel technique. The fundamental optical constants （the bandgap, liner refractive index, and absorption coefficient） were determined as a function of light wavelength by optical transmittance measurements. By single-beam Z-scan experiments with femtosecond laser pulses at a wavelength of 800 nm, the third-order nonlinear refraction index and two-photon absorption coefficient were measured to be -1.02× 10^-2 GW· cm^-2 and 100.31 GW· cm^-2, respectively. The results indicate that the BIT candidate for applications in nonlinear photonic devices. film is a promising
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