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Retention loss in the ferroelectric (SrBi<sub>2</sub>Ta<sub>2</sub>O<sub&
  • ISSN号：0295-5075
  • 期刊名称：EPL
  • 时间：2012.4
  • 页码：1-4
  • 相关项目：铁电薄膜及其存储器中界面与应变效应的研究
作者： Z. H.Zhang|X. L.Zhong|Y.Zhang|J. B.Wang|C. J.Lu|W. N.Ye|Y. C.Zhou|
同期刊论文项目
铁电薄膜及其存储器中界面与应变效应的研究
期刊论文 127 会议论文 1
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