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玻璃基Pt/Pb(Zr0.4Ti0.6)O3/ITO电容器的结构及物理性能研究
  • 期刊名称:周阳, 程春生, 赵敬伟, 郑红芳, 赵庆勋, 彭英才, 刘保亭, ”玻璃基Pt/Pb(Zr0.4T
  • 时间:0
  • 分类:TN104[电子电信—物理电子学] O484[理学—固体物理;理学—物理]
  • 作者机构:[1]河北大学物理科学与技术学院,保定071002, [2]保定学院,保定071000, [3]河北大学电子信息工程学院,保定071002
  • 相关基金:国家973前期专项(2007CB616910); 国家自然科学基金(60876055); 河北省自然科学基金(E2008000620 E2009000207); 教育部基金(207013); 河北省应用基础研究计划重点基础研究(08965124D)
  • 相关项目:硅基含铜铁电薄膜异质结集成研究
中文摘要:

采用溶胶-凝胶方法在玻璃基ITO电极上制备了Pt/Pb(Zr0.4Ti0.6)O3(PZT)/ITO电容器.采用X射线衍射仪、铁电测试仪、分光光度计对其微观结构、电学性能及光学性能进行了测量.结果表明PZT薄膜结晶良好,具有(101)高度择优取向.铁电电容器具有良好的保持特性和抗疲劳特性,具有较大的剩余极化强度和电阻率,5V电压下的剩余极化强度和电阻率分别为41.7μC/cm2和2.5×109Ω.cm;漏电流测量结果表明电压小于0.8V时为欧姆导电机制,当电压大于0.8V时,漏电流满足肖特基发射机制.光学透射谱结果表明在短波范围内,PZT表现出强吸收作用;在长波范围内,PZT表现为强透射,最大透射率达到95%.

英文摘要:

Pt/Pb(Zr0.4Ti0.6)O3(PZT)/ITO capacitors were fabricated on glass substrate,where PZT film was prepared by sol-gel method.The structural and physical properties of Pt/PZT/ITO capacitors were investigated.The microstructural,electrical and optical properties of Pt/PZT/ITO capacitors were characterized by X-ray diffraction(XRD),ferroelectric tester,UV-spectrophotometer,respectively.It is found that PZT is highly(101) oriented and well crystallized.Ferroelectric measurements indicate that Pt/PZT/ITO capacitor,measured at 5V,possesses good ferroelectric properties,such as fatigue-free characteristics,retention characteristics,large remnant polarization(41.7μC/cm2) and high resistivity(2.5×109Ω·cm).The analysis of the leakage current mechanism indicates that Pt/PZT/ITO capacitor showes Ohmic-like behaviour at low voltages(0.8V) and Schottky emission at high voltages(0.8V).From the optical measurement,stronger absorption in shortwave and stronger transmission in longwave range are observed.The maximum value of transmission reaches 95%.

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