利用MPMS-7(magnetic property moasurement system)型超导量子磁强计对垂直布里奇曼法生长的Hg0.89Mn0.11Te晶片磁化强度变化规律进行了测量.试验采用了两种不同的外场和冷却条件.首先在5K恒温下,-5200到5200kA/m范围内改变磁场强度进行了测定.然后维持800kA/m恒定磁场,分别在有场冷却和无场冷却条件下,从5到300K范围内改变温度,研究了变温条件下的磁化特性.并采用分子场近似模型,用类布里渊函数,最小二乘法对磁化强度随磁场强度变化的实验结果进行拟合和分析,结果表明,Mn^2+离子之间存在反铁磁相互作用.磁化率和温度关系分析表明:在测试范围内Hg0.89Mn0.11Te是单一的顺磁相,在高温区磁化率和温度服从居里-万斯定律,呈线性关系,低于40K时,磁化率和温度的关系偏离居里-万斯定律,表现出顺磁增强现象,
The magnetization measurements of Hg0.89 Mn0.11 Te sample grown by vertical Bridgman method have been carried out at 5 K under external field from - 5200 to 5200 kA/m, and at 800 kA/m from 5 to 300 K with zero-field-cooling and field-cooling respectively using the superconducting quantum interference device (SQUID) magnetometer. Based on the mean field theory, a modified Brillouin function is well fitted with the data of magnetization vs magnetic field over the entire magnetic field range. The analysis indicates that there is an antiferromagnetic exchange coupling between bin ions. The results of reciprocal susceptibility vs temperature show Curie-Weiss behaviors at temperatures above 40 K and a deviation from the Curie-Weiss law at temperatures from 5 to 40 K, which shows that the antfferromagnetic exchange coupling between Mn ions increases with decreasing temperature. The result was explained by extending higher-order terms in the calculation of susceptibility. Hg0.89Mn0.11 Te is a paramagnetic material in temperature range from 5 to 300