绝缘衬底上的硅(SOI)技术被誉为”21世纪的微电子技术”。它可消除或减轻体硅中的体效应、寄生效应及小尺寸效应等。该文对注氧隔离、键合再减薄、键合和注人相结合及外延层转移等SOI的几种主流制备技术进行了概述,着重介绍了SOI在抗辐照、耐高温等高性能专用电路、光电子、微机械方面以及三维集成电路等领域的主要应用,最后讨论了近几年来SOI技术研究和发展的新动向。
As a microelectronics technology in the 21st century, Silicon-on-insulator (SOI) can eliminate or alleviate body, parasitical and dimensional-scaling effects, etc. In this paper, we review the major methods of preparing SOI materials, which include separation by implanted oxygen, smartcut, bonding and etching back silicon, epitaxial layer transfer and other methods. Its applications in resisting high temperature and radiation devices, opto-electric and micro-mechanical devices and three-dimensional integrated circuits are particularly discussed. Meanwhile, new progress and fabrication methods of SOl technology are introduced.