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中文摘要：
针对现有选取方法直接以输入向量控制（IVC）产生电路最小时延为目标,不能有效地发挥门替换（GR）技术优势的问题,提出一种输入控制向量选取方法,用于协同IVC和GR技术缓解电路负偏置温度不稳定性（NBTI）老化的方案.首先以IVC可控制关键门输入引脚为逻辑1的数量最大为目标,从备选向量集中选取最优输入控制向量,用于电路的输入控制;然后对不能通过最优输入控制向量控制为逻辑1的关键门输入引脚,分析其GR可防护性,对GR可防护的输入引脚的驱动门实施门替换.实验结果表明,与现有选取方法相比,文中方案可平均提高电路时延退化改善率7.56%,相对提升达到32.64%,同时,需要付出的附加面积开销和附加固有时延开销还略有降低.
英文摘要：
Since the existing selection method to achieve minimum delay using input vector control（IVC） cannot effectively take the advantage of gate replacement（GR）, a method of selecting optimal input control vector is proposed in this paper for collaboration between IVC and GR to mitigate circuit aging induced by negative bias temperature instability（NBTI）. In this scheme, firstly the optimal input control vector is selected from the candidate vector set to control circuit inputs, in order to maximize the number of the critical gate input pins that can be set to logic 1 by IVC. Then the remaining input pins that cannot be set to logic 1 by the optimal input control vector are analyzed for their GR protectability, and GR is used to replace the driving gates of pins if the pins are GR protectable. The experimental results show that, in comparison with the existing scheme, the proposed scheme increases the circuit delay degradation improvement rate by 7.56% on average, showing a relative increase of 32.64%. At the same time, both the overhead for additional area and intrinsic delay are slightly reduced.
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