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Bi1.5Zn1.0Nb1.5O7 thin films deposited at low temperature and post-annealed for crystallization
  • ISSN号：0957-4522
  • 期刊名称：Journal of Materials Science: Materials in Electro
  • 时间：2013.5.5
  • 页码：1595-1600
  • 相关项目：纳米制造中的计量溯源与测试理论研究
作者： Xiaohua Zhang, Wei Ren, Peng Shi|
同期刊论文项目
纳米制造中的计量溯源与测试理论研究
期刊论文 90 会议论文 38 著作 1
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