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Enhanced ferroelectric properties of highly (100) oriented Pb(Zr0.52Ti0.48)O3thick films prepared by
  • 期刊名称：J. of Adv. Dielectrics
  • 时间：2013.2.2
  • 页码：1-8
  • 相关项目：纳米制造中的计量溯源与测试理论研究
作者： Wanlin Zhu, Wei Ren, Hong Xi, et al|
同期刊论文项目
纳米制造中的计量溯源与测试理论研究
期刊论文 90 会议论文 38 著作 1
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