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Structural, dielectric, ferroelectric and piezoresponse force microscopy characterizations of bilaye
  • ISSN号：0021-8979
  • 期刊名称：Journal of Applied Physics
  • 时间：2012.9.9
  • 页码：1-6
  • 相关项目：纳米制造中的计量溯源与测试理论研究
作者： Chen Ling|Ren Wei|Ye Zuo-Guang|Tian Aifen|Wu Xiaoqing|Shi Peng|
同期刊论文项目
纳米制造中的计量溯源与测试理论研究
期刊论文 90 会议论文 38 著作 1
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