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Multifractal analysis for Cu/Ti bilayer thin films
  • ISSN号：0142-2421
  • 期刊名称：Surface and Interface Analysis
  • 时间：2013.8.8
  • 页码：1223-1227
  • 相关项目：纳米制造中的计量溯源与测试理论研究
作者： Qijing Lin, Shuming Yang, Chenying Wang, et al|
同期刊论文项目
纳米制造中的计量溯源与测试理论研究
期刊论文 90 会议论文 38 著作 1
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