用MOCVD技术在(0001)蓝宝石衬底上成功研制了2寸衬底上无裂纹的AlN/Al0.3Ga0.7N超晶格材料。研究了AlxGa1-xN/AlN超晶格材料特性。结果表明,缓冲层材料和结构对AlN/Al0.3Ga0.7N超晶格的表面型貌和界面特性有很大的影响。AFM研究表明利用GaN做支撑层生长的AlN/Al0.3Ga0.7N超晶格材料是一种准二维生长模式。XRD和SEM研究表明研制的材料表面平整、界面清晰、并且材料具有完整的周期重复性。利用紫外-可见光谱仪反射谱研究表明研制的30对AlN/Al0.3Ga0.7N超晶格材料在中心波长为313nm的紫外波段具有93.5%的反射率。
AlN/Al0. 3Ga0. 7 N superlattices are grown on sapphire (0001) by metal-organic chemical vapor deposition (MOCVD). The reflectivity, SEM, AFM and XRD data of the AlxGa1-xN/AlN superlattices are presented. The result of atomic force microscopy indicates that the AlN/AlGaN superlattices grow on GaN template under quasi-two-dimensional mode. The superlattice has very smooth surface and the interface was distinct. No cracks are observed in the area of the 2-inch wafer.