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A Novel Testability-Oriented Data Path Scheduling Scheme in High-Level Synthesis
  • 时间:0
  • 分类:P283[天文地球—地图制图学与地理信息工程;天文地球—测绘科学与技术]
  • 作者机构:[1]Department of Automation Tsinghua University, [2]Department of Automation, [3]Tsinghua University, [4]Beijing 100084, [5]China
  • 相关基金:the National Key Basic Research and Development (973) of China (No. 2005CB321604);the National Natural Science Foundation of China (No. 60633060)
  • 相关项目:数字VLSI电路测试技术研究
中文摘要:

Scheduling is an important step in high-level synthesis and can greatly influence the testability of the synthesized circuits. This paper presents an efficient testability-improved data path scheduling scheme based on mobility scheduling, in which the scheduling begins from the operation with least mobility. In our data path scheduling scheme, the lifetimes of the I/O variables are made as short as possible to enlarge the possibility of the intermediate variables being allocated to the I/O registers. In this way, the controllability/observability of the intermediate variables can be improved. Combined with a weighted graph-based register allocation method, this scheme can obtain better testability. Experimental results on some benchmarks and example circuits show that the proposed scheme can get higher fault coverage compared with other scheduling schemes at little area overhead and even less time delay.

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