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Ying Zhang received his B,S. degree from Harbin Engineering University in 2006. He is currently a Ph.D. candidate in computer science at Institute of Computing Technology, Chinese Academy of Sciences. His research interests include signal integrity, reliable design of networkon-chip, and VLSI test.E-mail： zhangying@ict.ac.cn Corresponding Author Hua-Wei Li received her B.S. degree in computer science from Xiangtan University （China） in 1996, and M.S. and Ph.D. degrees from Institute of Computing Technology, Chinese Academy of Sciences, in 1999 and 2001 respectively. She is currently a professor at the Institute of Computing Technology, Chinese Academy of Sciences. Her research interests include VLSI/SoC design verification and test generation, delay test, and dependable computing. She is a senior member of IEEE. E-mail： lihuawei@ict.ac.cn Xiao-Wei Li received his B.Eng. and M.Eng. degrees in computer science from Hefei University of Technology, China, in 1985 and 1988, respectively, and his Ph.D. degree in computer science from the Institute of Computing Technology （ICT）, Chinese Academy of Sciences （CAS）, in 1991. Prom 1991 to 2000, he was an assistant professor and an associate professor （since 1993） in the Department of Computer Science, Peking University, China. He joined the ICT, CAS as a professor in 2000. He is now the deputy director of the Key Lab. of Computer System and Architecture, CAS. He is a senior member of IEEE. Dr. Li＇s research interests include VLSI testing, design for testability, design verification, dependable computing, wireless sensor networks. He has co-published over 150 papers in academic journals and international conference, hold 21 patents and 29 software copyrights. Dr. Li serves as chair of Technical Committee on Fault Tolerant Computing, CCF （China Computer Federation） since 2008. He serves as vice chair of IEEE Asian Pacific Regional TTTC （Test Technology Technical Council） since 2004. He serves as the steering committee vice- chair of IEEE Asian
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