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Statistical Elmore Delay of RC Interconnect Tree
  • 时间:0
  • 分类:TN3[电子电信—物理电子学]
  • 作者机构:[1]Key Laboratory of Wide Band-Gap Semiconductor Materials and Devices of Ministry of Education, School of Microelectronics, Xi-dian University, Xi'an 710071, China
  • 相关基金:Supported by the National Natural Science Foundation of China for Distinguished Young Scholars (Grant No. 60725415)
  • 相关项目:集成电路设计(包括CAD)
中文摘要:

一个二探查的系统被建立为一有限(7, 0 ) 碳化矽(原文如此) 经由 Au-C 联合到 Au (111 ) 表面的 nanotube 结合。使用非平衡格林功能(NEGF ) 把功能的理论(DFT ) 与密度相结合,上述系统为它的电子运输性质被学习。当偏爱电压比 1.4 V 大时,否定微分电阻(NDR ) 被观察。因为系统的运输性质对应用偏爱电压敏感, NDR 可能被传播系数的变化与偏爱电压引起。

英文摘要:

A two-probe system was established for a finite (7, 0) silicon carbide (SIC) nanotube coupled to Au (111) surfaces via Au-C bonds. Using the non-equilibrium Green function (NEGF) combined with density functional theory (DFT), the above system was studied for its electronic transport properties. Negative differential resistance (NDR) was observed when the bias voltage was greater than 1.4 V. Because the transport properties of the system were sensitive to the applied bias voltage, NDR might be caused by the fluctuation of the transmission coefficient with the bias voltage.

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